Ludwig Reimer
Scanning Electron Microscopy
Physics of Image Formation and Microanalysis
Paperback Engels 2010 2e druk 9783642083723Verwachte levertijd ongeveer 9 werkdagen
Samenvatting
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Specificaties
ISBN13:9783642083723
Taal:Engels
Bindwijze:paperback
Aantal pagina's:529
Uitgever:Springer Berlin Heidelberg
Druk:2
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Inhoudsopgave
Electron Optics of a Scanning Electron Microscope.- Electron Scattering and Diffusion.- Emission of Backscattered and Secondary Electrons.- Electron Detectors and Spectrometers.- Image Contrast and Signal Processing.- Electron-Beam-Induced Current and Cathodoluminescence.- Special Techniques in SEM.- Crystal Structure Analysis by Diffraction.- Elemental Analysis and Imaging with X-Rays.
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